Circuit Testing Based on Fuzzy Sampling with BDD Bases
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Date
2023-01-03
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1551
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Abstract
Fuzzy testing of integrated circuits is an established technique. Current approaches generate an approximately uniform random sample from a translation of the circuit to Boolean logic. These approaches have serious scalability issues, which become more pressing with the ever-increasing size of circuits. We propose using a base of binary decision diagrams to sample the translations as a soft computing approach. Uniformity is guaranteed by design and scalability is greatly improved. We test our approach against five other state-of-the-art tools and find our tool to outperform all of them, both in terms of performance and scalability.
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Soft Computing: Theory Innovations and Problem-Solving Benefits, bdd, circuits, fuzzy testing
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10
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Proceedings of the 56th Hawaii International Conference on System Sciences
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Attribution-NonCommercial-NoDerivatives 4.0 International
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