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Next Generation X-Ray Monitor for bunch-by-bunch monitoring of nanometer beam sizes at the world's highest luminosity particle collider

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Item Summary

Title:Next Generation X-Ray Monitor for bunch-by-bunch monitoring of nanometer beam sizes at the world's highest luminosity particle collider
Authors:Cercillieux, Julien Daisuke
Contributors:Varner, Gary S. (advisor)
Electrical Engineering (department)
Keywords:Electrical engineering
Physics
Instrumentation
Super-KEKB
XRM
Date Issued:Dec 2018
Publisher:University of Hawaiʻi at Mānoa
Abstract:Synchrotron radiation is commonly used in accelerators to monitor particle orbits. In most cases, these monitors are slow to read out and the digitizer's data typically do not include the information on individual particle bunches. After the announcement to upgrade KEKB to Super-KEKB, it was recognized that with a vertical beam-size of nanometers, to improve luminosity at the interaction point, there is a need for faster sampling and an ultra-low noise detector to monitor the beam and to determine beam-beam effects. The construction of the bunch-by-bunch X-ray Monitor (XRM) began in 2011, along with a new detector called Belle II.  The University of Hawaii at Manoa was tasked with three detectors (KLM, iTOP, and XRM). An improved version with new XRM sensors, amplifier design and an improved electronics aims to address the weaknesses uncovered in previous XRM versions. This thesis covers the design details of the next generation of x-ray monitors, analysis from preliminary data collection at the local test stand, and the preparation done for testing at the KEK photon factory.
Description:M.S. Thesis. University of Hawaiʻi at Mānoa 2018.
Pages/Duration:67 pages
URI:http://hdl.handle.net/10125/62403
Rights:All UHM dissertations and theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission from the copyright owner.
Appears in Collections: M.S. - Electrical Engineering


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