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How to Discover Knowledge for Improving Availability in the Manufacturing Domain?
|Title:||How to Discover Knowledge for Improving Availability in the Manufacturing Domain?|
|Keywords:||Reports from the Field|
CRISP-DM, Data Mining, Knowledge Discovery, Manufacturing, Overall Equipment Efficiency (OEE)
|Issue Date:||03 Jan 2018|
|Abstract:||This paper presents a specific process model for Knowledge Discovery in Databases (KDD) projects aiming at availability improvement in manufacturing. For this purpose, Overall Equipment Efficiency (OEE) is analyzed and used, since it is an approved approach to monitor and improve the degree of availability in manufacturing. To define the specific process model, we use the generic CRISPDM reference model and conduct a mapping for availability improvement. We prove the applicability of our model in the context of a specific KDD project in a large enterprise in the manufacturing industry.|
|Rights:||Attribution-NonCommercial-NoDerivatives 4.0 International|
|Appears in Collections:||Reports from the Field|
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