Please use this identifier to cite or link to this item: http://hdl.handle.net/10125/50441

How to Discover Knowledge for Improving Availability in the Manufacturing Domain?

File SizeFormat 
paper0554.pdf676.14 kBAdobe PDFView/Open

Item Summary

Title: How to Discover Knowledge for Improving Availability in the Manufacturing Domain?
Authors: Utz, Fabian
Neumann, Christian
Omid, Tafreschi
Keywords: Reports from the Field
CRISP-DM, Data Mining, Knowledge Discovery, Manufacturing, Overall Equipment Efficiency (OEE)
Issue Date: 03 Jan 2018
Abstract: This paper presents a specific process model for Knowledge Discovery in Databases (KDD) projects aiming at availability improvement in manufacturing. For this purpose, Overall Equipment Efficiency (OEE) is analyzed and used, since it is an approved approach to monitor and improve the degree of availability in manufacturing. To define the specific process model, we use the generic CRISPDM reference model and conduct a mapping for availability improvement. We prove the applicability of our model in the context of a specific KDD project in a large enterprise in the manufacturing industry.
Pages/Duration: 10 pages
URI/DOI: http://hdl.handle.net/10125/50441
ISBN: 978-0-9981331-1-9
DOI: 10.24251/HICSS.2018.552
Rights: Attribution-NonCommercial-NoDerivatives 4.0 International
Appears in Collections:Reports from the Field


Please contact sspace@hawaii.edu if you need this content in an alternative format.

Items in ScholarSpace are protected by copyright, with all rights reserved, unless otherwise indicated.