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Title: A study of the uses of scattered x-rays for internal standardization in x-ray spectroscopic analysis 
Author: Taylor, David LeRoy
Date: 1970
Publisher: [Honolulu]
Description: Typescript. Thesis (Ph. D.)--University of Hawaii, 1970. Bibliography: leaves 183-192. xiii, 192 l illus., graphs, tables
Rights: All UHM dissertations and theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission from the copyright owner.
Keywords: X-rays -- Scattering, X-ray spectroscopy

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